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Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
2
University of Chinese Academy of Sciences, Beijing 100049, China
2
Department of Engineering Physics, Tsinghua University, Beijing 100084, China
1
Institute of Modern Physics, Chinese Academy of Science, Lanzhou, 730000, China
1
Northwest Institute of Nuclear Technology, Xi’an 710024, China
1
Northwest Normal University, Lanzhou, 730000, China
1
School of Management, Taizhou Institute of Sci.&Tech, China
1
Science and Technology on Parallel and Distributed Processing Laboratory, National University of Defense Technology, Changsha 410073, China
1
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China
1
Science and Technology on Space Physics Laboratory, Beijing 100076, China
1
University of Chinese Academy of Sciences, Beijing 10049, China
1

当前资源共 6条

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1. ChinaXiv:202307.00231
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Internet and Subculture : Research on Virtual Identity of Zhihu Knowledge Sharing

分类：数字出版 >> 数字技术提交时间： 2023-07-23

Zhu Liu Jie

摘要： In recent years, with the gradual development of Internet

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点击量 430 下载量 56 评论 0
2. ChinaXiv:202306.00232
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Scalability of 3D deterministic particle transport on the Intel MIC architecture

分类：物理学 >> 核物理学提交时间： 2023-06-18 合作期刊: 《Nuclear Science and Techniques》

WANG Qing-Lin LIU Jie GONG Chun-Ye XING Zuo-Cheng

摘要：The key to large-scale parallel solutions of deterministic particle transport problem is single-

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点击量 857 下载量 125 评论 0
3. ChinaXiv:202306.00519
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Effectiveness and failure modes of error correcting code in industrial 65 nm CMOS SRAMs exposed to

分类：核科学技术 >> 核探测技术与核电子学提交时间： 2023-06-18 合作期刊: 《Nuclear Science and Techniques》

TONG Teng WANG Xiao-Hui ZHANG Zhan-Gang DING Peng-Cheng LIU Jie LIU Tian-Qi SU Hong

摘要： ineffectiveness of ECC module, including 1-, 2- and 3-bits errors in single word (not Multiple Bit Upsets), was

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点击量 90 下载量 38 评论 0
4. ChinaXiv:202306.00277
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A flexible and robust soft-error testing system for microelectronic devices and integrated circuits

分类：核科学技术 >> 核探测技术与核电子学提交时间： 2023-06-18 合作期刊: 《Nuclear Science and Techniques》

WANG Xiao-Hui TONG Teng SU Hong LIU Jie ZHANG Zhan-Gang GU Song LIU Tian-Qi KONG Jie ZHAO Xing-Wen YANG Zhen-Lei

摘要：Single event effects (SEEs) induced by radiations become a significant reliability challenge for

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点击量 530 下载量 119 评论 0
5. ChinaXiv:202306.00456
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A fractionation model based on three lognormal particle size distributions

分类：核科学技术 >> 核材料与工艺技术提交时间： 2023-06-18 合作期刊: 《Nuclear Science and Techniques》

SHANG Jian-Bo SHI Quan-Lin WANG Qun-Shu ZHONG Zhen-Yuan LEI Bei-Fang LIU Jie BAI Tao DAI Yi-Hua LI Mou

摘要：In this paper, a new model is proposed to calculate distribution of fission products in particles

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点击量 108 下载量 47 评论 0
6. ChinaXiv:202306.00235
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Azimuthal dependence of single-event and multiple-bit upsets in SRAM devices with anisotropic

分类：核科学技术 >> 核探测技术与核电子学提交时间： 2023-06-18 合作期刊: 《Nuclear Science and Techniques》

ZHANG Zhan-Gang LIU Jie HOU Ming-Dong SUN You-Mei SU Hong GU Song GENG Chao YAO Hui-Jun LUO Jie DUAN Jing-Lai MO Dan XI Kai EN Yun-Fei

摘要：Experimental evidence is presented showing obvious azimuthal dependence of single event upsets (SEU

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点击量 795 下载量 150 评论 0

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