Current Location:home > Browse

1. chinaXiv:201609.01042 [pdf]

The cosmic ray test of MRPCs for the BESIII ETOF upgrade

Wang Xiao-Zhuang; Heng Yue-Kun; Wu Zhi; Li Cheng; Sun Yong-Jie; Dai Hong-Liang; Sun Sheng-Sen; Yang Rong-Xing; Cao Ping; Zhang Jie; Wang Yun; Sun Wei-Jia; Wang Si-Yu; Ji Xiao-Lu; Zhao Jin-Zhou; Gong Wen-Xuan; Ye Mei; Ma Xiao-Yan; Chen Ming-Ming; Xu Mei-hang
Subjects: Physics >> Nuclear Physics

In order to improve the particle identification capability of the Beijing Spectrometer III (BESIII),t is proposed to upgrade the current endcap time-of-flight (ETOF) detector with multi-gap resistive plate chamber (MRPC) technology. Aiming at extending ETOF overall time resolution better than 100ps, the whole system including MRPC detectors, new-designed Front End Electronics (FEE), CLOCK module, fast control boards and time to digital modules (TDIG), was built up and operated online 3 months under the cosmic ray. The main purposes of cosmic ray test are checking the detectors' construction quality, testing the joint operation of all instruments and guaranteeing the performance of the system. The results imply MRPC time resolution better than 100ps, efficiency is about 98%燼nd the noise rate of strip is lower than 1Hz/(scm2) at normal threshold range, the details are discussed and analyzed specifically in this paper. The test indicates that the whole ETOF system would work well and satisfy the requirements of upgrade.

submitted time 2016-09-14 Hits1987Downloads1293 Comment 0

2. chinaXiv:201609.00002 [pdf]

The test of the electronics system for the BESIII ETOF upgrade

WANG Xiao-Zhuang; DAI Hong-Liang; WU Zhi; HENG Yue-Kun; Zhang Jie; CAO Ping; JI Xiao-Lu; Li Cheng; SUN Wei-Jia; WANG Si-Yu; WANG Yun
Subjects: Physics >> Nuclear Physics

It is proposed to upgrade the endcap time-of-flight (ETOF) of the Beijing Spectrometer III (BESIII) with multi-gap resistive plate chamber (MRPC), aiming at overall time resolution about 80 ps. After the entire electronics system is ready, some experiments, such as heat radiating, irradiation hardness and large-current beam tests,are carried out to certify the electronics' reliability and stability. The on-detector test of the electronics is also performed with the beam at BEPCII E3 line, the test results indicate that the electronics system fulfills its design requirements.

submitted time 2016-09-01 Hits2041Downloads1044 Comment 0

  [1 Pages/ 2 Totals]