Retina algorithm for heavy-ion tracking in single-event effects localization

摘要: at avoiding these adverse effects.As microelectronics con-tinuetoadvancetowardsgreatercomplexityandminiaturiza-ducedbynaturalradiationenvironmentshavealsobecomemore complex and severe [1-4].Currently, the main ef-fects of radiation-induced performance degradation in elec-tronic systems that have been identified are:total ionizingdose effects (TID)[5], displacement damage effects [6, 7],and single-event effects(SEE)[8].Spacemissions have in-dicated thatSEEsare animportant cause of anomaliesandfailures in spacecraft operations[9]. Satellites from variouscountrieshave sufferedfrom theharm caused bySEE.whichoriginates from ionizing cosmic rays with high energy[10]leading to two types of errors in spacecraft electronics.Softerrors are mainly caused by a single-event upset(SEU)[11]single-event transient (SET) [12],and single-event functioninterrupt(SEFI),whichcanchange thelogicalstateofa stor-ageunit andleadtodevice dysfunction.However,thedisor-der is always temporary and can be restored. Hard errors in-clude single-eventlatch-up(SEL)[13],single-eventburnout(SEB) [14],and single-event gate rupture (SEGR),etc., whichcan lead to permanent component damage and system fail-ure.Consequently, various methods have been adopted toconductradiationtestsandenhancetheradiationresistanceof ICs used in spacecraft [15-18].A common approach for SEE testing is to use heavy-ionbeamsgeneratedbyacceleratorsonthegroundtoirradiateelectronic devices. This irradiation approach is always em-ployedtoassesstheoverallradiationresistanceofdevicesrather than to evaluate the response of specific areas or mod-ulestoheavy-ionimpacts.Toreinforceadevicemoreef-fectively against radiation, it is necessary to identify the af-fected parts that trigger SEE and evaluate their sensitivity toSEE.For the real-time localization of SEE,the capability topromptly and effectively pinpoint the impact of radiation par-ticles on electronicdevicesunderradiationexposureis anim-portantresearchdirection.Therefore,itisimperative tode-ploy a swift and proficient particle-trajectory tracking algo-rithm.