The test of the electronics system for the BESIII ETOF upgrade

分类： 物理学 >> 核物理学 提交时间： 2016-09-01

WANG Xiao-Zhuang DAI Hong-Liang WU Zhi HENG Yue-Kun Zhang Jie CAO Ping JI Xiao-Lu Li Cheng SUN Wei-Jia WANG Si-Yu WANG Yun

摘要： It is proposed to upgrade the endcap time-of-flight (ETOF) of the Beijing Spectrometer III (BESIII) with multi-gap resistive plate chamber (MRPC), aiming at overall time resolution about 80 ps. After the entire electronics system is ready, some experiments, such as heat radiating, irradiation hardness and large-current beam tests,are carried out to certify the electronics' reliability and stability. The on-detector test of the electronics is also performed with the beam at BEPCII E3 line, the test results indicate that the electronics system fulfills its design requirements.

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