摘要: Cadmium telluride (CdTe) has been widely investigated as a room-temperature semiconductor for X/γ-ray detection. For detector-grade CdTe, high resistivity is necessary to suppress dark current, but resistivity alone is not sufficient to ensure efficient charge collection or stable spectroscopic response. Here, Cd-rich nominally undoped CdTe single crystals were grown by the vertical Bridgman method, with emphasis on the influence of excess-Cd-related defects on electrical uniformity and radiation response. Multi-position current-voltage measurements on a macroscopically continuous wafer revealed a resistivity variation of more than three orders of magnitude. Infrared transmission microscopy showed that the internal defects were spatially heterogeneous and appeared as isolated inclusions, needle-like features, radial clusters and inclusion-aggregation bands. Representative low-resistivity (LR) and high-resistivity (HR) specimens showed similar crystalline quality and near-infrared transmittance, indicating that the large electrical difference was mainly associated with the internal defect distribution rather than average structural degradation. Te-atmosphere annealing slightly increased the resistivity of the LR specimen, while residual inclusion cores remained after annealing. Au/CdTe/Au devices fabricated from the HR specimen exhibited a linear X-ray dose-rate response, and the average sensitivity increased from 20.8 to 71.5 mC Gy air -1 cm -2 as the electric field increased from 50 to 200 V mm -1 . A measurable 241 Am γ-ray response was also obtained, with the energy resolution improving from 22.01% to 12.57% under higher bias. These results indicate that Cd-rich growth can produce HR undoped CdTe with measurable X/γ-ray response, but Cd-related inclusion heterogeneity remains major obstacles to detector-grade performance. Control of excess-Cd distribution is therefore essential for developing undoped CdTe crystals for room-temperature radiation detection.
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来自:
zhu, Dr. zhicheng
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分类:
物理学
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核物理学
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备注:
已向《Nuclear Science and Techniques》投稿
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引用:
ChinaXiv:202606.00059
(或此版本
ChinaXiv:202606.00059V1)
DOI:10.12074/202606.00059
CSTR:32003.36.ChinaXiv.202606.00059
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科创链TXID:
5f43b789-f56b-461e-95ab-0ca7dd028d90
- 推荐引用方式:
zhu, Dr. zhicheng,Wang, Dr. Xinxin,Ni, Dr. Youbao,Wang, Dr. Shimao,Yu, Dr. Xuezhou,Huang, Dr. Changbao,Wu, Dr. Haixin,Qi, Dr. Huabei,Li, Dr. Ya,Yu, Dr. Ping,Chen, Dr. Weihao,Tang, Mr. Zichen.Influence of Cd-related inclusion defects on X/γ-ray response in Cd-rich nominally undoped CdTe single crystals for radiation detection.中国科学院科技论文预发布平台.[DOI:10.12074/202606.00059]
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